Our paper “Mechanical spectroscopy of materials using atomic force microscopy (AFM-MS)” got accepted to Materials Today.

We’re thrilled to announce the publication of our novel AFM-MS technique in Materials Today, pushing the boundaries of material identification and analysis: see the paper. It is based on the use of atomic force microscopy (AFM, SPM) combined with AI (machine learning).

Open Science: Full Python code available in supplementary materials for community use and advancement.

AFM-MS is capable of identification of materials at each pixel of the microscopy image. As an example, we demonstrated the material resolution of 1.6 nm (0.1nm is the size of the atom). Presently, there is no technology capable of attaining such a high resolution.